Stochastic reliability modeling, optimization and applications [electronic resource] / editors, Syouji Nakamura, Toshio Nakagawa.

Contributor(s): Material type: TextTextPublication details: Singapore ; Hackensack, NJ : World Scientific, c2010.Description: xvi, 300 p. : illSubject(s): Genre/Form: DDC classification:
  • 620/.00452 22
LOC classification:
  • TA169 .S765 2010eb
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Includes bibliographical references.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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