Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthday / editors, Syouji Nakamura, Kinjo Gakuin University, Japan, Cun Hua Qian, Nanjing University of Technology, China, Mingchih Chen, Fe Jen Catholic University, Taiwan.

Contributor(s): Material type: TextTextPublisher: New Jersey : World Scientific, [2014]Copyright date: ©2014Description: 1 online resource (379 pages) : illustrationsContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9789814571944 (e-book)
Subject(s): Genre/Form: LOC classification:
  • TA169 .R45 2014eb
Online resources:
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Description based on online resource; title from PDF title page (ebrary, viewed February 5, 2014).

Electronic reproduction. Palo Alto, Calif. : ebrary, 2014. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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