ISTFA 2004
ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts / [electronic resource] :
sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2004, ASTM International.
- Materials Park, OH : ASM International, c2004.
- [717] p. : ill.
Includes bibliographical references and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2009.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Electronics--Materials--Testing--Congresses.
Electronic apparatus and appliances--Testing--Congresses.
Electronic books.
TK7871 / .I68 2004eb
Includes bibliographical references and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2009.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Electronics--Materials--Testing--Congresses.
Electronic apparatus and appliances--Testing--Congresses.
Electronic books.
TK7871 / .I68 2004eb