ISTFA 2003
ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California / [electronic resource] :
Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003 Conference proceedings from the 29th International Symposium for Testing and Failure Analysis
sponsored by EDFAS.
- Materials Park, Ohio : ASM International, 2003.
- 518 p. : ill.
Includes bibliographical references and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2009.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Electronics--Materials--Testing--Congresses.
Electronic apparatus and appliances--Testing--Congresses.
Electronic books.
TK7871 / .I68 2003eb
Includes bibliographical references and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2009.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Electronics--Materials--Testing--Congresses.
Electronic apparatus and appliances--Testing--Congresses.
Electronic books.
TK7871 / .I68 2003eb