Monte Carlo modeling for electron microscopy and microanalysis
Joy, David C., 1943-
Monte Carlo modeling for electron microscopy and microanalysis [electronic resource] / David C. Joy. - New York : Oxford University Press, 1995. - viii, 216 p. : ill. - Oxford series in optical and imaging sciences ; 9 . - Oxford series in optical and imaging sciences ; 9. .
Includes bibliographical references.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2011.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Electron microscopy--Computer simulation.
Electron probe microanalysis--Computer simulation.
Monte Carlo method.
Electronic books.
QH212.E4 / J67 1995eb
502/.8/25
Monte Carlo modeling for electron microscopy and microanalysis [electronic resource] / David C. Joy. - New York : Oxford University Press, 1995. - viii, 216 p. : ill. - Oxford series in optical and imaging sciences ; 9 . - Oxford series in optical and imaging sciences ; 9. .
Includes bibliographical references.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2011.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Electron microscopy--Computer simulation.
Electron probe microanalysis--Computer simulation.
Monte Carlo method.
Electronic books.
QH212.E4 / J67 1995eb
502/.8/25