Scanning probe microscopy

Scanning probe microscopy [electronic resource] / editors, Nikodem Tomczak, Kuan Eng Johnson Goh. - Singapore ; Hackensack, N.J. : World Scientific Pub. Co., 2011. - xiv, 261 p. : ill. (some col.)

Includes bibliographical references and index.


Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2011.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.




Scanning probe microscopy.
Nanoelectronics.


Electronic books.

QH212.S33 / S33 2011eb