Reliability and radiation effects in compound semiconductors

Johnston, Allan.

Reliability and radiation effects in compound semiconductors [electronic resource] / Allan Johnston. - Hackensack, N.J. : World Scientific, 2010. - xii, 363 p. : ill.

Includes bibliographical references and index.


Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2011.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.




Compound semiconductors.


Electronic books.

QC611.8.C64 / J64 2010eb