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From artefacts to atoms :

Quinn, T. J.

From artefacts to atoms : the BIPM and the search for ultimate measurement standards / Terry Quinn. - 1 online resource (464 pages) : illustrations

Includes index.

ISBN: 9780199909919 (e-book)

Subjects--Corporate Names:
International Bureau of Weights and Measures.

Subjects--Topical Terms:
Metric system.

Index Terms--Genre/Form:
Electronic books.

LC Class. No.: QC91 / .Q46 2012eb

Dewey Class. No.: 389/.15

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