Beam effects, surface topography, and depth profiling in surface analysis

Beam effects, surface topography, and depth profiling in surface analysis [electronic resource] / edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell. - New York : Plenum Press, c1998. - xix, 430 p. : ill. - Methods of surface characterization ; v. 5 . - Methods of surface characterization ; v. 5. .

Includes bibliographical references and index.


Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2013.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.






Surfaces (Technology)--Analysis.
Materials--Effect of radiation on.


Electronic books.

TA418.7 / .B43 1998eb

620/.44