Characterization of high Tc materials and devices by electron microscopy
Characterization of high Tc materials and devices by electron microscopy [electronic resource] /
edited by Nigel D. Browning, Stephen J. Pennycook.
- Cambridge ; New York : Cambridge University Press, 2000.
- xii, 391 p. : ill.
Includes bibliographical references.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2013.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
High temperature superconductors.
Electron microscopy--Technique.
Electronic books.
QC611.98.H54 / C43 2000eb
537.6/23/0284
Includes bibliographical references.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2013.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
High temperature superconductors.
Electron microscopy--Technique.
Electronic books.
QC611.98.H54 / C43 2000eb
537.6/23/0284