High performance memory testing
Adams, R. Dean.
High performance memory testing design principles, fault modeling, and self-test / [electronic resource] : R. Dean Adams. - Boston : Kluwer Academic, c2003. - xiii, 246 p. : ill. - Frontiers in electronic testing . - Frontiers in electronic testing. .
Includes bibliographical references (p. [229]-239) and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2013.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Semiconductor storage devices--Testing.
Computer storage devices--Testing.
Electronic books.
TK7895.M4 / A27 2003eb
621.39/732
High performance memory testing design principles, fault modeling, and self-test / [electronic resource] : R. Dean Adams. - Boston : Kluwer Academic, c2003. - xiii, 246 p. : ill. - Frontiers in electronic testing . - Frontiers in electronic testing. .
Includes bibliographical references (p. [229]-239) and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2013.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Semiconductor storage devices--Testing.
Computer storage devices--Testing.
Electronic books.
TK7895.M4 / A27 2003eb
621.39/732