VLSI test principles and architectures

VLSI test principles and architectures design for testability / [electronic resource] : edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. - Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006. - xxx, 777 p. : ill. ; 25 cm. - The Morgan Kaufmann series in systems on silicon . - Morgan Kaufmann series in systems on silicon. .

Includes bibliographical references and index.


Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2009.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.






Integrated circuits--Very large scale integration--Testing.
Integrated circuits--Very large scale integration--Design.


Electronic books.

TK7874.75 / .V587 2006eb

621.39/5