X-ray fluorescence spectrometry and related techniques (Record no. 197542)

MARC details
000 -LEADER
fixed length control field 07236nam a2200649 a 4500
001 - CONTROL NUMBER
control field ebr10661538
003 - CONTROL NUMBER IDENTIFIER
control field CaPaEBR
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20180830115320.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS
fixed length control field m eo d
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr cn |||m|||a
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 130222s2013 nyua foab 001 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781606503935 (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 1606503936 (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9781606503911 (print)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 160650391X (print)
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.5643/9781606503935
Source of number or code doi
040 ## - CATALOGING SOURCE
Original cataloging agency CaBNVSL
Transcribing agency CaBNVSL
Modifying agency CaBNVSL
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)829322779
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QC482.S6
Item number M278 2013
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 537.5352
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Margu�i, Eva.
245 10 - TITLE STATEMENT
Title X-ray fluorescence spectrometry and related techniques
Medium [electronic resource] :
Remainder of title an introduction /
Statement of responsibility, etc. Eva Margu�i, Ren�e Van Grieken.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. [New York, N.Y.] (222 East 46th Street, New York, NY 10017) :
Name of publisher, distributor, etc. Momentum Press,
Date of publication, distribution, etc. 2013.
300 ## - PHYSICAL DESCRIPTION
Extent 1 electronic text (xv, 142 p.) :
Other physical details ill., digital file.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references (p. 133-138) and index.
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Preface -- Series preface -- Series editor -- About the authors --
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 1. Introduction -- 1.1 Basic principles of x-ray fluorescence -- 1.2 Interactions of x-rays with matter -- 1.3 X-ray safety and protection --
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 2. Basic components of x-ray fluorescence spectrometers -- 2.1 General introduction -- 2.2 Excitation sources -- 2.2.1 X-ray tubes -- 2.2.2 Radioisotopes -- 2.2.3 Other sources -- 2.3 Sample chamber -- 2.4 Detection system -- 2.4.1 Types of detectors -- 2.4.1.1 Gas-filled detectors -- 2.4.1.2 Scintillation detectors -- 2.4.1.3 Solid-state detectors -- 2.4.2 Resolution and efficiency -- 2.4.2.1 Resolution -- 2.4.2.2 Efficiency -- 2.4.3 Comparison of detection systems -- 2.4.4 Detector artifacts -- 2.4.4.1 Escape peaks -- 2.4.4.2 Sum peaks (pile-up effect) -- 2.4.5 Signal processing system -- 2.5 Source and detector modifiers -- 2.5.1 Filters -- 2.5.1.1 Primary filters -- 2.5.1.2 Detector filters -- 2.5.2 Secondary targets -- 2.5.3 Focusing optics -- 2.5.4 Dispersing systems -- 2.5.5 Collimators -- 2.5.6 Masks -- 2.6 Instrument configurations --
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 3. Qualitative and quantitative x-ray fluorescence analysis -- 3.1 Evaluation of x-ray fluorescence spectra -- 3.2 Qualitative XRF analysis -- 3.3 Quantitative XRF analysis -- 3.3.1 Chemical matrix effects -- 3.3.1.1 Absorption effects -- 3.3.1.2 Enhancement effects -- 3.3.2 Correction and compensation methods -- 3.3.2.1 Compensation methods -- 3.3.2.2 Matrix correction methods -- 3.3.2.3 Overview of correction and compensation methods -- 3.3.3 Quality of XRF analytical results -- 3.3.3.1 Limits of detection (LOD) and quantification (LOQ) -- 3.3.3.2 Working range and linearity -- 3.3.3.3 Precision and accuracy -- 3.3.3.4 Quality control of the results --
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 4. Sample preparation procedures -- 4.1 Introduction -- 4.2 General sample preparation procedures -- 4.2.1 Solid samples -- 4.2.1.1 Direct XRF analysis -- 4.2.1.2 Powdered specimen -- 4.2.1.3 Fused specimen -- 4.2.1.4 Digested specimen -- 4.2.2 Liquid samples -- 4.2.2.1 Preconcentration methods -- 4.3 Specific sample preparation procedures --
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 5. Wavelength/energy dispersive x-ray fluorescence spectrometry (WDXRF/EDXRF) -- 5.1 Introduction and basic principles -- 5.2 WDXRF and EDXRF layouts -- 5.2.1 WDXRF instrumentation -- 5.2.2 EDXRF instrumentation -- 5.3 Comparison of WDXRF and EDXRF systems -- 5.4 Applications of WDXRF and case studies -- 5.4.1 Determination of metal residues in active pharmaceutical ingredients -- 5.4.2 Determination of heavy metal content in automotive -- shredder residues (ASR) -- 5.4.3 Metal determination in polluted soils and waters -- 5.5 Applications of EDXRF and case studies -- 5.5.1 Determination of heavy metals at trace levels in vegetation samples -- 5.5.2 Determination of Cu, Ni, Zn, Pb, and Cd in aqueous samples -- 5.5.3 Chemical characterization of aerosol samples --
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 6. Total Reflection X-Ray Spectrometry (TXRF) -- 6.1 Introduction and basic principles -- 6.2 TXRF layout -- 6.3 Analytical capabilities of TXRF systems -- 6.3.1 Chemical analysis -- 6.3.1.1 Sample carriers -- 6.3.1.2 Sample treatment procedures for chemical analysis by TXRF -- 6.3.1.3 Quantification -- 6.3.2 Surface analysis -- 6.4 Other applications of TXRF and case studies -- 6.4.1 Multielement determination in waste water effluents -- 6.4.2 Determination of trace amounts of Se in soil samples -- 6.4.3 Analysis of Si wafer surfaces --
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 7. Special XRF configurations and related techniques -- 7.1 Introduction -- 7.2 Microbeam X-ray fluorescence spectrometry ([mu]-XRF) -- 7.3 Synchrotron radiation-induced X-ray emission (SRXRF or SRIXE) -- 7.4 Particle-induced X-ray emission (PIXE) -- 7.5 Electron-induced X-ray emission -- 7.5.1 Scanning electron microscope (SEM) -- 7.5.2 Electron microprobe analysis (EMPA) --
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 8. Overview of XRF and related techniques -- 8.1 Introduction -- 8.2 Comparative performance of XRF systems -- 8.3 Role of XRF spectrometry in analysis field -- 8.4 Future perspectives --
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note Buyer's guide to manufacturers -- Glossary of abbreviations and acronyms -- References -- Bibliography -- Books and encyclopedia chapters -- Journals -- Index.
506 1# - RESTRICTIONS ON ACCESS NOTE
Terms governing access Restricted to libraries which purchase an unrestricted PDF download via an IP.
520 3# - SUMMARY, ETC.
Summary, etc. X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF.
530 ## - ADDITIONAL PHYSICAL FORM AVAILABLE NOTE
Additional physical form available note Also available in print.
538 ## - SYSTEM DETAILS NOTE
System details note Mode of access: World Wide Web.
538 ## - SYSTEM DETAILS NOTE
System details note System requirements: Adobe Acrobat reader.
588 ## - SOURCE OF DESCRIPTION NOTE
Source of description note Title from PDF t.p. (viewed on February 22, 2013).
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element X-ray spectroscopy.
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term X-ray fluorescence spectrometry (XRF)
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Energy dispersive X-ray fluorescence spectrometry (EDXRF)
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Wavelength dispersive X-ray fluorescence spectrometry (WDXRF)
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Total reflection X-ray fluorescence spectrometry (TXRF)
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Micro-XRF
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Synchrotron radiation-induced X-ray emission (SRXRF)
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Metals
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Sample preparation
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term XRF instrumentation
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Industrial analysis
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Environmental analysis
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Geochemical analysis
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Grieken, R. van (Ren�e)
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Print version:
International Standard Book Number 160650391X
-- 9781606503911
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="http://site.ebrary.com/lib/daystar/Doc?id=10661538">http://site.ebrary.com/lib/daystar/Doc?id=10661538</a>
Public note An electronic book accessible through the World Wide Web; click to view

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