System-on-chip test architectures (Record no. 85792)

MARC details
000 -LEADER
fixed length control field 01674nam a2200397 a 4500
001 - CONTROL NUMBER
control field 0000096638
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20171002054957.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS
fixed length control field m u
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr cn|||||||||
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 070604s2008 ne a sb 001 0 eng
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
Canceled/invalid LC control number 2007023373
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9780123739735 (hardcover : alk. paper)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 012373973X (hardcover : alk. paper)
035 ## - SYSTEM CONTROL NUMBER
System control number (CaPaEBR)ebr10203465
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)228148482
040 ## - CATALOGING SOURCE
Original cataloging agency CaPaEBR
Transcribing agency CaPaEBR
050 14 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7895.E42
Item number S978 2008eb
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.39/5
Edition number 22
245 00 - TITLE STATEMENT
Title System-on-chip test architectures
Medium [electronic resource] :
Remainder of title nanometer design for testability /
Statement of responsibility, etc. edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Amsterdam ;
-- Boston :
Name of publisher, distributor, etc. Morgan Kaufmann Publishers,
Date of publication, distribution, etc. c2008.
300 ## - PHYSICAL DESCRIPTION
Extent xxxvi, 856 p. :
Other physical details ill.
490 1# - SERIES STATEMENT
Series statement The Morgan Kaufmann series in systems on silicon
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references and index.
533 ## - REPRODUCTION NOTE
Type of reproduction Electronic reproduction.
Place of reproduction Palo Alto, Calif. :
Agency responsible for reproduction ebrary,
Date of reproduction 2013.
Note about reproduction Available via World Wide Web.
-- Access may be limited to ebrary affiliated libraries.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Systems on a chip
General subdivision Testing.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Integrated circuits
General subdivision Very large scale integration
-- Testing.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Integrated circuits
General subdivision Very large scale integration
-- Design.
655 #7 - INDEX TERM--GENRE/FORM
Genre/form data or focus term Electronic books.
Source of term local
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Wang, Laung-Terng.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Stroud, Charles E.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Touba, Nur A.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element ebrary, Inc.
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Morgan Kaufmann series in systems on silicon.
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="http://site.ebrary.com/lib/daystar/Doc?id=10203465">http://site.ebrary.com/lib/daystar/Doc?id=10203465</a>
Public note An electronic book accessible through the World Wide Web; click to view
908 ## - PUT COMMAND PARAMETER (RLIN)
Put command parameter 170314
942 00 - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Electronic Book

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