ISTFA 2007 [electronic resource] : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International.

By: Contributor(s): Material type: TextTextPublication details: Materials Park, OH : ASM International, c2007.Description: xvi, 356 p. : illOther title:
  • Proceedings of the 33rd International Symposium for Testing and Failure Analysis
  • 33rd International Symposium for Testing and Failure Analysis
  • Thirty-third International Symposium for Testing and Failure Analysis
Subject(s): Genre/Form: LOC classification:
  • TK7871 .I6847 2007eb
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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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