Bayesian analysis of stochastic process models [electronic resource] / David Rios Insua, Fabrizio Ruggeri, Michael P. Wiper.

By: Contributor(s): Material type: TextTextSeries: Wiley series in probability and statisticsPublication details: Hoboken, New Jersey : Wiley, 2012.Description: xiii, 290 p. : illSubject(s): Genre/Form: DDC classification:
  • 519.5/42 23
LOC classification:
  • QA279.5 .R56 2012eb
Online resources:
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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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