Cluster secondary ion mass spectrometry [electronic resource] : principles and applications / edited by Christine M. Mahoney.

Contributor(s): Material type: TextTextPublication details: Hoboken, N.J. : John Wiley & Sons, Inc., 2013.Description: 348 pSubject(s): Genre/Form: DDC classification:
  • 543/.65 23
LOC classification:
  • QD96.S43 M34 2013eb
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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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