ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA / sponsored by Electronic Device Failure Analysis Society.
Material type:
- text
- computer
- online resource
- 9781627080231 (e-book)
- 621.381 23
- TK7871 .I584 2013eb
Includes bibliographical references at the end of each chapters and index.
Description based on online resource; title from PDF title page (ebrary, viewed August 30, 2014).
Electronic reproduction. Palo Alto, Calif. : ebrary, 2014. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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