Electron microscopy and analysis [electronic resource] / Peter J. Goodhew, John Humphreys, Richard Beanland.

By: Contributor(s): Material type: TextTextPublication details: London : Taylor & Francis, 2001.Edition: 3rd edDescription: xi, 251 p. : illSubject(s): Genre/Form: DDC classification:
  • 502.825 21
LOC classification:
  • QH212.E4 G62 2001eb
Online resources:
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Previous ed.: 1988.

Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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