Boundary-scan interconnect diagnosis [electronic resource] / José T. de Sousa, Peter Y.K. Cheung.

By: Contributor(s): Material type: TextTextSeries: Frontiers in electronic testing ; 18.Publication details: Boston : Kluwer Academic Publishers, c2001.Description: xxi, 168 p. : illSubject(s): Genre/Form: DDC classification:
  • 621.381 21
LOC classification:
  • TK7870.23 .S64 2001eb
Online resources:
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Includes bibliographical references (p. 145-150) and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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