Scanning force microscopy [electronic resource] : with applications to electric, magnetic, and atomic forces / Dror Sarid.

By: Contributor(s): Material type: TextTextSeries: Oxford series in optical and imaging sciences ; 5.Publication details: New York : Oxford University Press, 1994.Edition: Rev. edDescription: xiii, 263 p. : illSubject(s): Genre/Form: LOC classification:
  • QH212.S32 S27 1994eb
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Includes bibliographical references (p. 233-259) and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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