Data model patterns [electronic resource] : a metadata map / David C. Hay.

By: Contributor(s): Material type: TextTextSeries: Morgan Kaufmann series in data management systemsPublication details: Amsterdam ; Boston : Elsevier Morgan Kaufmann, c2006.Description: xx, 406 p. : illSubject(s): Genre/Form: DDC classification:
  • 005.74 22
LOC classification:
  • QA76.9.D37 H38 2006eb
Online resources:
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Includes bibliographical references (p. 391-394) and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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