Oxide reliability [electronic resource] : a summary of silicon oxide wearout, breakdown, and reliability / editor, D.J. Dumin.

Contributor(s): Material type: TextTextSeries: Selected topics in electronics and systems ; v. 23.Publication details: [River Edge, NJ] : World Scientific, c2002.Description: ix, 270 p. : illSubject(s): Genre/Form: DDC classification:
  • 621.39/732 21
LOC classification:
  • TK7871.99.M44 O95 2002eb
Online resources:
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Includes bibliographical references.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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