System and Bayesian reliability [electronic resource] : essays in honor of Professor Richard E. Barlow on his 70th birthday / editors, Yu Hayakawa, Telba Irony, Min Xie.

Contributor(s): Material type: TextTextSeries: Series on quality, reliability & engineering statistics ; v. 5.Publication details: River Edge, NJ : World Scientific, c2001.Description: xxvii, 409 p. : illSubject(s): Genre/Form: LOC classification:
  • TA169 .S977 2001eb
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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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