TY  - BOOK
AU  - Voldman,Steven H.
ED  - ebrary, Inc.
TI  - ESD: failure mechanisms and models 
AV  - TK7871.852 .V65 2009eb
U1  - 621.381 22
PY  - 2009///
CY  - Chichester, West Sussex, U.K., Hoboken, NJ
PB  - J. Wiley
KW  - Semiconductors
KW  - Failures
KW  - Integrated circuits
KW  - Protection
KW  - Testing
KW  - Reliability
KW  - Electric discharges
KW  - Electrostatics
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2009; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/daystar/Doc?id=10317806
ER  -