TY  - BOOK
ED  - International Symposium for Testing and Failure Analysis
ED  - ASM International.
ED  - Electronic Device Failure Analysis Society.
ED  - ebrary, Inc.
TI  - ISTFA 2002: proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. 
AV  - TK7871 .I684 2002eb
PY  - 2002///
CY  - Materials Park, OH
PB  - ASM International
KW  - Electronics
KW  - Materials
KW  - Testing
KW  - Congresses
KW  - Electronic apparatus and appliances
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2009; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/daystar/Doc?id=10320302
ER  -