TY  - BOOK
ED  - International Symposium for Testing and Failure Analysis
ED  - ASM International.
ED  - ebrary, Inc.
TI  - ISTFA 2006: proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA
AV  - TK7871 .I68 2006eb
PY  - 2006///
CY  - Materials Park, OH
PB  - ASM International
KW  - Electronics
KW  - Materials
KW  - Testing
KW  - Congresses
KW  - Electronic apparatus and appliances
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2009; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/daystar/Doc?id=10328965
ER  -