Joy, David C.,  1943- <br/><br/>
Monte Carlo modeling for electron microscopy and microanalysis  [electronic resource] / 
David C. Joy. 
 - New York :  Oxford University Press,  1995. 
 - viii, 216 p. :  ill. 
 - Oxford series in optical and imaging sciences ;  9 .
 - Oxford series in optical and imaging sciences ;  9. .
<br/><br/>Includes bibliographical references. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2011. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
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<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopy--Computer simulation.<br/>Electron probe microanalysis--Computer simulation.<br/>Monte Carlo method.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>QH212.E4  / J67 1995eb 
<br/><br/><label>Dewey Class. No.: </label>502/.8/25