Characterization and behavior of interfaces proceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA / [electronic resource] :
[edited by] J. David Frost.
- Washington, D.C. : IOS Press, 2010.
- x, 155 p. : ill.
Includes index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2010. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.