Operational risk management  a practical approach to intelligent data analysis /  [electronic resource] : 
edited by Ron S. Kenett, Yossi Raanan. 
 - Chichester ;  [Hoboken] :  John Wiley & Sons,  2010. 
 - xxxvii, 285 p. :  ill. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2010. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
<br/><br/><label>ISBN: </label>
<br/><br/><label>LCCN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Risk management.<br/>Quality control.<br/>Information technology--Quality control.<br/>Process control.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>HD61  / .O66 2010eb 
<br/><br/><label>Dewey Class. No.: </label>658.15/5