Bahukudumbi, Sudarshan. <br/><br/>
Wafer-level testing and test during burn-in for integrated circuits  [electronic resource] / 
Sudarshan Bahukudumbi, Krishnendu Chakrabarty. 
 - Boston :  Artech House,  2010. 
 - xv, 198 p. :  ill. 
 - Artech House integrated microsystems series .
 - Artech House integrated microsystems series. .
<br/><br/>Includes bibliographical references and index. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2011. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
<br/><br/><label>ISBN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Testing.<br/>Integrated circuits--Wafer-scale integration.<br/>Semiconductors--Testing.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TK7874  / .B35 2010eb 
<br/><br/><label>Dewey Class. No.: </label>621.38132