TY  - BOOK
AU  - Bahukudumbi,Sudarshan
AU  - Chakrabarty,Krishnendu
ED  - ebrary, Inc.
TI  - Wafer-level testing and test during burn-in for integrated circuits
T2  - Artech House integrated microsystems series
AV  - TK7874 .B35 2010eb
U1  - 621.38132 22
PY  - 2010///
CY  - Boston
PB  - Artech House
KW  - Integrated circuits
KW  - Testing
KW  - Wafer-scale integration
KW  - Semiconductors
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2011; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/daystar/Doc?id=10412729
ER  -