Multiscale analysis of deformation and failure of materials [electronic resource] /
Jinghong Fan.
- Chichester, West Sussex, U.K. ; Hoboken, NJ : Wiley, 2011.
- xxvi, 481 p. : ill.
- Microsystem and nanotechnology series .
Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2011. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.