Johnston, Allan. <br/><br/>
Reliability and radiation effects in compound semiconductors  [electronic resource] / 
Allan Johnston. 
 - Hackensack, N.J. :  World Scientific,  2010. 
 - xii, 363 p. :  ill. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2011. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
<br/><br/><label>ISBN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Compound semiconductors.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>QC611.8.C64  / J64 2010eb