TY  - BOOK
AU  - Tan,Cher Ming
ED  - ebrary, Inc.
TI  - Electromigration in ULSI interconnections
T2  - International series on advances in solid state electronics and technology (ASSET)
AV  - TK7874.76 .T36 2010eb
PY  - 2010///
CY  - Hackensack, N.J.
PB  - World Scientific
KW  - Integrated circuits
KW  - Ultra large scale integration
KW  - Electrodiffusion
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2013; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/daystar/Doc?id=10480052
ER  -