Haugstad, Greg,  1963- <br/><br/>
Atomic force microscopy  exploring basic modes and advanced applications /  [electronic resource] : 
Greg Haugstad. 
 - Hoboken, N.J. :  John Wiley & Sons,  c2012. 
 - xxii, 464 p. :  ill. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2011. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
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<br/><br/><label>Subjects--Topical Terms: </label><br/>Atomic force microscopy.<br/>Scanning proble microscopy.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>QH212.A78  / H38 2012eb 
<br/><br/><label>Dewey Class. No.: </label>620/.5