TY  - BOOK
AU  - Haugstad,Greg
ED  - ebrary, Inc.
TI  - Atomic force microscopy: exploring basic modes and advanced applications 
AV  - QH212.A78 H38 2012eb
U1  - 620/.5 23
PY  - 2012///
CY  - Hoboken, N.J.
PB  - John Wiley & Sons
KW  - Atomic force microscopy
KW  - Scanning proble microscopy
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2011; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/daystar/Doc?id=10606048
ER  -