Cluster secondary ion mass spectrometry  principles and applications /  [electronic resource] : 
edited by Christine M. Mahoney. 
 - Hoboken, N.J. :  John Wiley & Sons, Inc.,  2013. 
 - 348 p. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2013. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
<br/><br/><label>ISBN: </label>
<br/><br/><label>LCCN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Secondary ion mass spectrometry.<br/>Mass spectrometry.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>QD96.S43  / M34 2013eb 
<br/><br/><label>Dewey Class. No.: </label>543/.65