Stangl, Julian. <br/><br/>
Nanobeam x-ray scattering :  probing matter at the nanoscale / 
Julian Stangl [and three others]. 
 - 1 online resource (392 pages) :  illustrations 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9783527655090 (ebook) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron probe microanalysis.<br/>Nanotechnology.<br/>X-rays--Scattering.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>QC482.S3  / S82 2014eb 
<br/><br/><label>Dewey Class. No.: </label>539.7222