ServĂn, Manuel, Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla. - 1 online resource (345 pages) : illustrations Includes bibliographical references and index. ISBN: 9783527681082 (e-book) Subjects--Topical Terms: Diffraction patterns--Data processing.Image processing--Data processing. Index Terms--Genre/Form: Electronic books. LC Class. No.: QC415 / .S478 2014eb Dewey Class. No.: 621.36