TY  - BOOK
AU  - Servín,Manuel
AU  - Quiroga,J.Antonio
AU  - Padilla,J.Moises
TI  - Fringe pattern analysis for optical metrology: theory, algorithms, and applications 
AV  - QC415 .S478 2014eb
U1  - 621.36 23
PY  - 2014///
CY  - Weinheim, Germany
PB  - Wiley-VCH Verlag GmbH & Co. KGaA
KW  - Diffraction patterns
KW  - Data processing
KW  - Image processing
KW  - Electronic books
N1  - Includes bibliographical references and index
UR  - http://site.ebrary.com/lib/daystar/Doc?id=10881255
ER  -