ISTFA 2013 :  conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA / 
sponsored by Electronic Device Failure Analysis Society. 
 - 1 online resource (633 pages) :  color illustrations, charts, photographs, graphs, tables 
<br/><br/>Includes bibliographical references at the end of each chapters and index. 
<br/><br/><label>ISBN: </label>9781627080231 (e-book) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronics--Materials--Testing--Congresses.<br/>Electronic apparatus and appliances--Testing--Congresses.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TK7871  / .I584 2013eb 
<br/><br/><label>Dewey Class. No.: </label>621.381