ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
organized by Electronic Device Failure Analysis Society, ASM International.
- 1 online resource (560 pages) : color illustrations, photographs
Includes index.
9781627080750 (e-book)
Electronics--Materials--Testing--Congresses. Electronic apparatus and appliances--Testing--Congresses.