TY  - BOOK
ED  - International Symposium for Testing and Failure Analysis
ED  - Electronic Device Failure Analysis Society,
ED  - ASM International,
TI  - ISTFA 2014: conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA 
AV  - TK7871 .I884 2014eb
U1  - 621.381 23
PY  - 2014///
CY  - Materials Park, Ohio
PB  - ASM International
KW  - Electronics
KW  - Materials
KW  - Testing
KW  - Congresses
KW  - Electronic apparatus and appliances
KW  - Electronic books
N1  - Includes index
UR  - http://site.ebrary.com/lib/daystar/Doc?id=10998999
ER  -