Nonlinear transistor model parameter extraction techniques [electronic resource] /
edited by Matthias Rudolph, Christian Fager, David E. Root.
- Cambridge ; New York : Cambridge University Press, c2012.
- xiv, 352 p. : ill.
- The Cambridge RF and microwave engineering series .
- Cambridge RF and microwave engineering series. .
Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2012. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.