TY  - BOOK
AU  - Czanderna,Alvin Warren
AU  - Madey,Theodore E.
AU  - Powell,C.J.
ED  - ebrary, Inc.
TI  - Beam effects, surface topography, and depth profiling in surface analysis
T2  - Methods of surface characterization
AV  - TA418.7 .B43 1998eb
U1  - 620/.44 21
PY  - 1998///
CY  - New York
PB  - Plenum Press
KW  - Surfaces (Technology)
KW  - Analysis
KW  - Materials
KW  - Effect of radiation on
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2013; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/daystar/Doc?id=10046976
ER  -