Sarid, Dror. <br/><br/>
Scanning force microscopy  with applications to electric, magnetic, and atomic forces /  [electronic resource] : 
Dror Sarid. 
 - Rev. ed. 
 - New York :  Oxford University Press,  1994. 
 - xiii, 263 p. :  ill. 
 - Oxford series in optical and imaging sciences ;  5 .
 - Oxford series in optical and imaging sciences ;  5. .
<br/><br/>Includes bibliographical references (p. 233-259) and index. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2013. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning force microscopy.<br/>Surfaces (Physics)
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>QH212.S32  / S27 1994eb