Journey to data quality  [electronic resource] / 
Yang W. Lee ... [et al.]. 
 - Cambridge, Mass. :  MIT Press,  c2006. 
 - xii, 226 p. :  ill. 
<br/><br/>Includes bibliographical references (p. [215]-221) and index. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2013. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
<br/><br/><label>ISBN: </label>
<br/><br/><label>LCCN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Business--Data processing--Management.<br/>Database management--Quality control.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>HF5548.2  / .J68 2006eb 
<br/><br/><label>Dewey Class. No.: </label>658.4/038