Data model patterns a metadata map / [electronic resource] :
David C. Hay.
- Amsterdam ; Boston : Elsevier Morgan Kaufmann, c2006.
- xx, 406 p. : ill.
- The Morgan Kaufmann series in data management systems .
- Morgan Kaufmann series in data management systems. .
Includes bibliographical references (p. 391-394) and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.