TY  - BOOK
AU  - Nakamura,Takashi
ED  - ebrary, Inc.
TI  - Terrestrial neutron-induced soft errors in advanced memory devices
AV  - TK7895.M4 T47 2008eb
PY  - 2008///
CY  - Hackensack, NJ
PB  - World Scientific
KW  - Semiconductor storage devices
KW  - Neutron irradiation
KW  - Radiation dosimetry
KW  - Nuclear physics
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references (p. 291-315) and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2009; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/daystar/Doc?id=10255560
ER  -